Hitachi-High-Tech (Japan)

Hitachi FESEM (Field Emission Scanning Electron Microscopes)

Schottky Field Emission Scanning Electron Microscope SU5000

The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. Expert or novice, the result is now the same: Highest quality n

View Details

Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000

The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collecti

View Details

Ultrahigh-Resolution Scanning Electron Microscope SU8600

The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, increased system stability,

View Details

Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, high probe current, automation, effi

View Details

Ultra-high Resolution Scanning Electron Microscope SU9000

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging an

View Details

High Resolution Schottky Scanning Electron Microscope SU3800SE/SE Plus SU3900SE/SE Plus

The SU3900SE/SU3800SE Series Microscopes are FE-SEMs that offer high-resolution observation capabilities. They combine easy data acquisition through simple operation with much larger and heavier specimens than existing FE-SEMs. This makes it possible to o

View Details