Hitachi-High-Tech (Japan)

Hitachi SEM (Scanning Electron Microscope)

Scanning Electron Microscope FlexSEM 1000 II

FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. O

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Scanning Electron Microscopes SU3800/SU3900

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is

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